%0 Journal Article %1 journals/tcad/HaznedarGZKOP06 %A Haznedar, Haldun %A Gall, Martin %A Zolotov, Vladimir %A Ku, Pon Sung %A Oh, Chanhee %A Panda, Rajendran %D 2006 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 6 %P 1038-1046 %T Impact of stress-induced backflow on full-chip electromigration risk assessment. %U http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#HaznedarGZKOP06 %V 25

@article{journals/tcad/HaznedarGZKOP06, added-at = {2020-09-24T00:00:00.000+0200}, author = {Haznedar, Haldun and Gall, Martin and Zolotov, Vladimir and Ku, Pon Sung and Oh, Chanhee and Panda, Rajendran}, biburl = {https://www.bibsonomy.org/bibtex/289bea8319b32d30a8ded05c2f77b577e/dblp}, ee = {https://doi.org/10.1109/TCAD.2005.855941}, interhash = {8ef182b398351a29a9e2fa18a59536b4}, intrahash = {89bea8319b32d30a8ded05c2f77b577e}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 6, pages = {1038-1046}, timestamp = {2020-09-25T11:47:08.000+0200}, title = {Impact of stress-induced backflow on full-chip electromigration risk assessment.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#HaznedarGZKOP06}, volume = 25, year = 2006 }