%0 Conference Paper %1 conf/iccad/SunLLLG13 %A Sun, Shupeng %A Li, Xin %A Liu, Hongzhou %A Luo, Kangsheng %A Gu, Ben %B ICCAD %D 2013 %E Henkel, Jörg %I IEEE %K dblp %P 478-485 %T Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#SunLLLG13 %@ 978-1-4799-1069-4

@inproceedings{conf/iccad/SunLLLG13, added-at = {2017-05-24T00:00:00.000+0200}, author = {Sun, Shupeng and Li, Xin and Liu, Hongzhou and Luo, Kangsheng and Gu, Ben}, biburl = {https://www.bibsonomy.org/bibtex/2600f0bc8cec0085ebd2de3972593b93a/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2013}, editor = {Henkel, Jörg}, ee = {http://dl.acm.org/citation.cfm?id=2561923}, interhash = {9009c619d6eebf01dbf9d40635a06b51}, intrahash = {600f0bc8cec0085ebd2de3972593b93a}, isbn = {978-1-4799-1069-4}, keywords = {dblp}, pages = {478-485}, publisher = {IEEE}, timestamp = {2019-10-17T22:45:18.000+0200}, title = {Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#SunLLLG13}, year = 2013 }