%0 Journal Article %1 RIBE2003 %A Ribes, G. %A Bruyere, S. %A Monsieur, F. %A Roy, D. %A Huard, V. %D 2003 %J Microelectronics Reliability %K imported %P pp. 1211–1214 %T New insights into the change of voltage acceleration and temperature activation of oxide breakdown %V 43

@article{RIBE2003, added-at = {2013-01-07T16:10:56.000+0100}, author = {Ribes, G. and Bruyere, S. and Monsieur, F. and Roy, D. and Huard, V.}, biburl = {https://www.bibsonomy.org/bibtex/29c9e53758373005cf23743fafea1e383/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Plankensteiner\\DISS\\Literature_lifetimeModels\\Ribes_2003.pdf:PDF}, interhash = {91899551863b45ec56a9e6cf0ea62a0f}, intrahash = {9c9e53758373005cf23743fafea1e383}, journal = {Microelectronics Reliability}, keywords = {imported}, owner = {plankensteiner}, pages = {pp. 1211–1214}, timestamp = {2013-01-07T16:11:12.000+0100}, title = {New insights into the change of voltage acceleration and temperature activation of oxide breakdown}, volume = 43, year = 2003 }