%0 Conference Paper %1 conf/irps/VandemaeleKBFCMMHG23 %A Vandemaele, Michiel %A Kaczer, Ben %A Bury, Erik %A Franco, Jacopo %A Chasin, Adrian %A Makarov, Alexander %A Mertens, Hans %A Hellings, Geert %A Groeseneken, Guido %B IRPS %D 2023 %I IEEE %K dblp %P 1-10 %T Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandemaeleKBFCMMHG23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/VandemaeleKBFCMMHG23, added-at = {2023-09-30T00:00:00.000+0200}, author = {Vandemaele, Michiel and Kaczer, Ben and Bury, Erik and Franco, Jacopo and Chasin, Adrian and Makarov, Alexander and Mertens, Hans and Hellings, Geert and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/209a1d5430ec46ada1fe17bbad834497a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118211}, interhash = {91ebfade1512e108179fadb062db97ad}, intrahash = {09a1d5430ec46ada1fe17bbad834497a}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandemaeleKBFCMMHG23}, year = 2023 }