%0 Journal Article %1 journals/et/CuiSM03 %A Cui, Hailong %A Seth, Sharad C. %A Mehta, Shashank K. %D 2003 %J J. Electron. Test. %K dblp %N 3 %P 271-284 %T Modeling Fault Coverage of Random Test Patterns. %U http://dblp.uni-trier.de/db/journals/et/et19.html#CuiSM03 %V 19

@article{journals/et/CuiSM03, added-at = {2020-09-11T00:00:00.000+0200}, author = {Cui, Hailong and Seth, Sharad C. and Mehta, Shashank K.}, biburl = {https://www.bibsonomy.org/bibtex/2285acdaedac42f0d4e6e34e16ddb5b04/dblp}, ee = {https://doi.org/10.1023/A:1023796929359}, interhash = {940b2f91e9a3a9d6dddba7c1e6f649a2}, intrahash = {285acdaedac42f0d4e6e34e16ddb5b04}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {271-284}, timestamp = {2020-09-12T11:41:47.000+0200}, title = {Modeling Fault Coverage of Random Test Patterns.}, url = {http://dblp.uni-trier.de/db/journals/et/et19.html#CuiSM03}, volume = 19, year = 2003 }