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Modeling Fault Coverage of Random Test Patterns.

, , и . J. Electron. Test., 19 (3): 271-284 (2003)

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A nonparametric classifier for unsegmented text., , , , , , и . DRR, том 5296 из SPIE Proceedings, стр. 102-108. SPIE, (2004)Predicting Fault Coverage from Probabilistic Testability.. ITC, стр. 803-807. IEEE Computer Society, (1985)STEM: Spatiotemporal Management of Capacity for Intra-core Last Level Caches., , и . MICRO, стр. 163-174. IEEE Computer Society, (2010)A system for recognizing a large class of engineering drawings., , и . ICDAR, стр. 791-794. IEEE Computer Society, (1995)0-8186-7128-9.On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design., , и . VLSI Design, стр. 491-496. IEEE Computer Society, (2005)Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects., , , и . Asian Test Symposium, стр. 297-302. IEEE Computer Society, (2011)Efficient Test Compaction for Pseudo-Random Testing., , и . Asian Test Symposium, стр. 337-342. IEEE Computer Society, (2005)Adaptive Segmentation of Document Images., и . ICDAR, стр. 827-831. IEEE Computer Society, (2001)High-level microprogramming: an optimizing C compiler for a processing element of a CAD accelerator., , и . MICRO, стр. 97-106. ACM/IEEE, (1990)Estimating the Quality of Manufactured Digital Sequential Circuits., , и . ITC, стр. 210-217. IEEE Computer Society, (1991)