%0 Conference Paper %1 conf/itc/MadgeBTDSR04 %A Madge, Robert %A Benware, Brady %A Turakhia, Ritesh P. %A Daasch, W. Robert %A Schuermyer, Chris %A Ruffler, Jens %B ITC %D 2004 %I IEEE Computer Society %K dblp %P 203-212 %T In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. %U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#MadgeBTDSR04 %@ 0-7803-8581-0

@inproceedings{conf/itc/MadgeBTDSR04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Madge, Robert and Benware, Brady and Turakhia, Ritesh P. and Daasch, W. Robert and Schuermyer, Chris and Ruffler, Jens}, biburl = {https://www.bibsonomy.org/bibtex/2135a4ecc6ffa3bbd0fff5bcc20aecbc9/dblp}, booktitle = {ITC}, crossref = {conf/itc/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ITC.2004.96}, interhash = {99e0df04352d310c2ec67385ecbc58bf}, intrahash = {135a4ecc6ffa3bbd0fff5bcc20aecbc9}, isbn = {0-7803-8581-0}, keywords = {dblp}, pages = {203-212}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:43.000+0200}, title = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#MadgeBTDSR04}, year = 2004 }