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Другие публикации лиц с тем же именем

Diagnosis of failing scan cells through orthogonal response compaction., , , , , и . European Test Symposium, стр. 221-226. IEEE Computer Society, (2010)Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models., , , , , , , , и . ATS, стр. 318-323. IEEE Computer Society, (2014)Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis., , , и . ITC, стр. 9. IEEE Computer Society, (2005)Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC., , и . ITC, стр. 7. IEEE Computer Society, (2005)The value of statistical testing for quality, yield and test cost improvement., , , и . ITC, стр. 10. IEEE Computer Society, (2005)A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores., , , , и . ITC, стр. 1-9. IEEE Computer Society, (2011)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , и . IEEE Des. Test Comput., 23 (5): 390-400 (2006)Distributed dynamic partitioning based diagnosis of scan chain., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2013)Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data., , , , , , , , , и 1 other автор(ы). ATS, стр. 219-224. IEEE Computer Society, (2017)Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs., , , и . VTS, стр. 39-46. IEEE Computer Society, (2003)