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%0 Conference Paper
%1 conf/irps/WuFTRTVBGLK21
%A Wu, Zhicheng
%A Franco, Jacopo
%A Truijen, Brecht
%A Roussel, Philippe
%A Tyaginov, Stanislav
%A Vandemaele, Michiel
%A Bury, Erik
%A Groeseneken, Guido
%A Linten, Dimitri
%A Kaczer, Ben
%B IRPS
%D 2021
%I IEEE
%K dblp
%P 1-6
%T Physics-based device aging modelling framework for accurate circuit reliability assessment.
%U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#WuFTRTVBGLK21
%@ 978-1-7281-6893-7
@inproceedings{conf/irps/WuFTRTVBGLK21,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Wu, Zhicheng and Franco, Jacopo and Truijen, Brecht and Roussel, Philippe and Tyaginov, Stanislav and Vandemaele, Michiel and Bury, Erik and Groeseneken, Guido and Linten, Dimitri and Kaczer, Ben},
biburl = {https://www.bibsonomy.org/bibtex/279e5e7c6bf82c69df99c4b40254a45d5/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2021},
ee = {https://doi.org/10.1109/IRPS46558.2021.9405106},
interhash = {9a5f6ac63a521dc3a8a44f44c1007ada},
intrahash = {79e5e7c6bf82c69df99c4b40254a45d5},
isbn = {978-1-7281-6893-7},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T12:18:55.000+0200},
title = {Physics-based device aging modelling framework for accurate circuit reliability assessment.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#WuFTRTVBGLK21},
year = 2021
}