%0 Conference Paper %1 conf/ats/DililloGPVBH04 %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Virazel, Arnaud %A Borri, Simone %A Hage-Hassan, Magali Bastian %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 266-271 %T Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#DililloGPVBH04 %@ 0-7695-2235-1

@inproceedings{conf/ats/DililloGPVBH04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Virazel, Arnaud and Borri, Simone and Hage-Hassan, Magali Bastian}, biburl = {https://www.bibsonomy.org/bibtex/278ac6eebfe69e3115779f6ad440a3bd5/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.75}, interhash = {a5b16e282b258e9dd867ad770a99137e}, intrahash = {78ac6eebfe69e3115779f6ad440a3bd5}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {266-271}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#DililloGPVBH04}, year = 2004 }