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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

, , , , , , , und . Review of Scientific Instruments, 80 (3): 033905 (2009)
DOI: 10.1063/1.3100200

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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis | Browse - Review of Scientific Instruments

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