Inproceedings,
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.
P. Öhler, S. Hellebrand, and H. Wunderlich.DDECS, page 185-190. IEEE Computer Society, (2007)
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- BibTeX key
- conf/ddecs/OhlerHW07
- entry type
- inproceedings
- booktitle
- DDECS
- year
- 2007
- pages
- 185-190
- publisher
- IEEE Computer Society
- crossref
- conf/ddecs/2007
- ee
- https://doi.ieeecomputersociety.org/10.1109/DDECS.2007.4295278
- isbn
- 1-4244-1161-0
- url
- http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#OhlerHW07
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- please select -%0 Conference Paper
%1 conf/ddecs/OhlerHW07
%A Öhler, Philipp
%A Hellebrand, Sybille
%A Wunderlich, Hans-Joachim
%B DDECS
%D 2007
%E Girard, Patrick
%E Krasniewski, Andrzej
%E Gramatová, Elena
%E Pawlak, Adam
%E Garbolino, Tomasz
%I IEEE Computer Society
%K dblp
%P 185-190
%T Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.
%U http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#OhlerHW07
%@ 1-4244-1161-0
@inproceedings{conf/ddecs/OhlerHW07,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Öhler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
biburl = {https://www.bibsonomy.org/bibtex/2239e4858ab1089b300d0217042b20f55/dblp},
booktitle = {DDECS},
crossref = {conf/ddecs/2007},
editor = {Girard, Patrick and Krasniewski, Andrzej and Gramatová, Elena and Pawlak, Adam and Garbolino, Tomasz},
ee = {https://doi.ieeecomputersociety.org/10.1109/DDECS.2007.4295278},
interhash = {b23bd9d160d959a6c6e89c08dc2efe57},
intrahash = {239e4858ab1089b300d0217042b20f55},
isbn = {1-4244-1161-0},
keywords = {dblp},
pages = {185-190},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:40:49.000+0200},
title = {Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.},
url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#OhlerHW07},
year = 2007
}