%0 Journal Article %1 journals/ieicet/KawashimaFMNNYHE07 %A Kawashima, Shoichiro %A Fukushi, Isao %A Morita, Keizo %A ichi Nakabayashi, Ken %A Nakazawa, Mitsuharu %A Yamane, Kazuaki %A Hirayama, Tomohisa %A Endo, Toru %D 2007 %J IEICE Trans. Electron. %K dblp %N 10 %P 1941-1948 %T A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet90c.html#KawashimaFMNNYHE07 %V 90-C

@article{journals/ieicet/KawashimaFMNNYHE07, added-at = {2020-04-11T00:00:00.000+0200}, author = {Kawashima, Shoichiro and Fukushi, Isao and Morita, Keizo and ichi Nakabayashi, Ken and Nakazawa, Mitsuharu and Yamane, Kazuaki and Hirayama, Tomohisa and Endo, Toru}, biburl = {https://www.bibsonomy.org/bibtex/2e6d07442005c7cb781a23767a8a91bee/dblp}, ee = {https://doi.org/10.1093/ietele/e90-c.10.1941}, interhash = {b245dea77fa84bba37b5a44e819b539f}, intrahash = {e6d07442005c7cb781a23767a8a91bee}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 10, pages = {1941-1948}, timestamp = {2020-04-14T12:03:13.000+0200}, title = {A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet90c.html#KawashimaFMNNYHE07}, volume = {90-C}, year = 2007 }