Inproceedings,
On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.
A. Dhayni, S. Mir, L. Rufer, and A. Bounceur.VLSI-SoC, volume 240 of IFIP, page 245-266. Springer, (2005)
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- inproceedings
- booktitle
- VLSI-SoC
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- 2005
- pages
- 245-266
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- Springer
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- IFIP
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- 240
- crossref
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- ee
- https://doi.org/10.1007/978-0-387-73661-7_16
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- 978-0-387-73660-0
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- http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#DhayniMRB05
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%1 conf/vlsi/DhayniMRB05
%A Dhayni, Achraf
%A Mir, Salvador
%A Rufer, Libor
%A Bounceur, Ahcène
%B VLSI-SoC
%D 2005
%E da Luz Reis, Ricardo Augusto
%E Osseiran, Adam
%E Pfleiderer, Hans-Jörg
%I Springer
%K dblp
%P 245-266
%T On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.
%U http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#DhayniMRB05
%V 240
%@ 978-0-387-73660-0
@inproceedings{conf/vlsi/DhayniMRB05,
added-at = {2018-06-26T00:00:00.000+0200},
author = {Dhayni, Achraf and Mir, Salvador and Rufer, Libor and Bounceur, Ahcène},
biburl = {https://www.bibsonomy.org/bibtex/20aaffe18c05df768675ed100464b19d0/dblp},
booktitle = {VLSI-SoC},
crossref = {conf/vlsi/2005soc},
editor = {da Luz Reis, Ricardo Augusto and Osseiran, Adam and Pfleiderer, Hans-Jörg},
ee = {https://doi.org/10.1007/978-0-387-73661-7_16},
interhash = {b2dacee01c867d05297d88a473e9762e},
intrahash = {0aaffe18c05df768675ed100464b19d0},
isbn = {978-0-387-73660-0},
keywords = {dblp},
pages = {245-266},
publisher = {Springer},
series = {IFIP},
timestamp = {2018-06-27T13:12:42.000+0200},
title = {On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.},
url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#DhayniMRB05},
volume = 240,
year = 2005
}