%0 Journal Article %1 journals/tvlsi/EganM05 %A Egan, Tom %A Mourad, Samiha %D 2005 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 8 %P 984-988 %T Design-for-testability for embedded delay-locked loops. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#EganM05 %V 13

@article{journals/tvlsi/EganM05, added-at = {2021-03-10T00:00:00.000+0100}, author = {Egan, Tom and Mourad, Samiha}, biburl = {https://www.bibsonomy.org/bibtex/2470d0ff2df2fc288ef496818bea13673/dblp}, ee = {https://doi.org/10.1109/TVLSI.2005.853622}, interhash = {b39f55755db9fb374d891d449ef072fe}, intrahash = {470d0ff2df2fc288ef496818bea13673}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 8, pages = {984-988}, timestamp = {2024-04-08T14:32:02.000+0200}, title = {Design-for-testability for embedded delay-locked loops.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#EganM05}, volume = 13, year = 2005 }