%0 Conference Paper %1 conf/irps/MonishmuraliKBS23 %A Monishmurali, M. %A Kranthi, Nagothu Karmel %A Boselli, Gianluca %A Shrivastava, Mayank %B IRPS %D 2023 %I IEEE %K dblp %P 1-5 %T Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#MonishmuraliKBS23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/MonishmuraliKBS23, added-at = {2023-05-24T00:00:00.000+0200}, author = {Monishmurali, M. and Kranthi, Nagothu Karmel and Boselli, Gianluca and Shrivastava, Mayank}, biburl = {https://www.bibsonomy.org/bibtex/23175441d988cfffdb18e279dc0dcb440/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117638}, interhash = {b54f2099e50057e748bc004189a06899}, intrahash = {3175441d988cfffdb18e279dc0dcb440}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#MonishmuraliKBS23}, year = 2023 }