%0 Conference Paper %1 conf/ofc/CroesSTRSTFA22 %A Croes, Kristof %A Simons, Veerle %A Truijen, Brecht %A Roussel, Philippe %A Sever, Koen Van %A Tsiara, Artemisia %A Franco, Jacopo %A Absil, Philippe %B OFC %D 2022 %I IEEE %K dblp %P 1-3 %T Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. %U http://dblp.uni-trier.de/db/conf/ofc/ofc2022.html#CroesSTRSTFA22 %@ 978-1-55752-466-9

@inproceedings{conf/ofc/CroesSTRSTFA22, added-at = {2022-04-20T00:00:00.000+0200}, author = {Croes, Kristof and Simons, Veerle and Truijen, Brecht and Roussel, Philippe and Sever, Koen Van and Tsiara, Artemisia and Franco, Jacopo and Absil, Philippe}, biburl = {https://www.bibsonomy.org/bibtex/27da528be923dfdd6912c1de317d42689/dblp}, booktitle = {OFC}, crossref = {conf/ofc/2022}, ee = {https://ieeexplore.ieee.org/document/9748701}, interhash = {bbefe76db14f3bd022377d0b96d5cb92}, intrahash = {7da528be923dfdd6912c1de317d42689}, isbn = {978-1-55752-466-9}, keywords = {dblp}, pages = {1-3}, publisher = {IEEE}, timestamp = {2024-04-09T21:53:45.000+0200}, title = {Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.}, url = {http://dblp.uni-trier.de/db/conf/ofc/ofc2022.html#CroesSTRSTFA22}, year = 2022 }