%0 Conference Paper %1 conf/drc/HoangDWKKQISWP22 %A Hoang, Lauren %A Daus, Alwin %A Wahid, Sumaiya %A Kwon, Jimin %A Ko, Jung-Soo %A Qin, Shengjun %A Islam, Mahnaz %A Saraswat, Krishna C. %A Wong, H.-S. Philip %A Pop, Eric %B DRC %D 2022 %I IEEE %K dblp %P 1-2 %T Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. %U http://dblp.uni-trier.de/db/conf/drc/drc2022.html#HoangDWKKQISWP22 %@ 978-1-6654-9883-8

@inproceedings{conf/drc/HoangDWKKQISWP22, added-at = {2023-11-12T00:00:00.000+0100}, author = {Hoang, Lauren and Daus, Alwin and Wahid, Sumaiya and Kwon, Jimin and Ko, Jung-Soo and Qin, Shengjun and Islam, Mahnaz and Saraswat, Krishna C. and Wong, H.-S. Philip and Pop, Eric}, biburl = {https://www.bibsonomy.org/bibtex/21f1b70dbf7dabf947313a4cd4ed91952/dblp}, booktitle = {DRC}, crossref = {conf/drc/2022}, ee = {https://doi.org/10.1109/DRC55272.2022.9855789}, interhash = {bdae4ade7f370db3aff9cf19ed07efa9}, intrahash = {1f1b70dbf7dabf947313a4cd4ed91952}, isbn = {978-1-6654-9883-8}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T23:47:33.000+0200}, title = {Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties.}, url = {http://dblp.uni-trier.de/db/conf/drc/drc2022.html#HoangDWKKQISWP22}, year = 2022 }