%0 Journal Article %1 journals/mr/CorsoASNLSNC07 %A Corso, Domenico %A Aurite, S. %A Sciacca, E. %A Naso, D. %A Lombardo, Salvatore %A Santangelo, A. %A Nicotra, M. C. %A Cascino, S. %D 2007 %J Microelectron. Reliab. %K dblp %N 4-5 %P 806-809 %T Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#CorsoASNLSNC07 %V 47

@article{journals/mr/CorsoASNLSNC07, added-at = {2022-08-30T00:00:00.000+0200}, author = {Corso, Domenico and Aurite, S. and Sciacca, E. and Naso, D. and Lombardo, Salvatore and Santangelo, A. and Nicotra, M. C. and Cascino, S.}, biburl = {https://www.bibsonomy.org/bibtex/28acb74f2f1beb8244cb4d43a50c55255/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.01.011}, interhash = {c8dc41a07244b7e0b691fae65a29d092}, intrahash = {8acb74f2f1beb8244cb4d43a50c55255}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {4-5}, pages = {806-809}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#CorsoASNLSNC07}, volume = 47, year = 2007 }