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%0 Journal Article
%1 journals/mr/CorsoASNLSNC07
%A Corso, Domenico
%A Aurite, S.
%A Sciacca, E.
%A Naso, D.
%A Lombardo, Salvatore
%A Santangelo, A.
%A Nicotra, M. C.
%A Cascino, S.
%D 2007
%J Microelectron. Reliab.
%K dblp
%N 4-5
%P 806-809
%T Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.
%U http://dblp.uni-trier.de/db/journals/mr/mr47.html#CorsoASNLSNC07
%V 47
@article{journals/mr/CorsoASNLSNC07,
added-at = {2022-08-30T00:00:00.000+0200},
author = {Corso, Domenico and Aurite, S. and Sciacca, E. and Naso, D. and Lombardo, Salvatore and Santangelo, A. and Nicotra, M. C. and Cascino, S.},
biburl = {https://www.bibsonomy.org/bibtex/28acb74f2f1beb8244cb4d43a50c55255/dblp},
ee = {https://doi.org/10.1016/j.microrel.2007.01.011},
interhash = {c8dc41a07244b7e0b691fae65a29d092},
intrahash = {8acb74f2f1beb8244cb4d43a50c55255},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {4-5},
pages = {806-809},
timestamp = {2024-04-09T02:49:59.000+0200},
title = {Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#CorsoASNLSNC07},
volume = 47,
year = 2007
}