%0 Journal Article %1 journals/chinaf/ChenZZMZZZMH23 %A Chen, Yilin %A Zhu, Qing %A Zhu, Jie-Jie %A Mi, Minhan %A Zhang, Meng %A Zhou, Yuwei %A Zhao, Ziyue %A Ma, Xiaohua %A Hao, Yue %D 2023 %J Sci. China Inf. Sci. %K dblp %N 2 %T Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light. %U http://dblp.uni-trier.de/db/journals/chinaf/chinaf66.html#ChenZZMZZZMH23 %V 66

@article{journals/chinaf/ChenZZMZZZMH23, added-at = {2023-03-02T00:00:00.000+0100}, author = {Chen, Yilin and Zhu, Qing and Zhu, Jie-Jie and Mi, Minhan and Zhang, Meng and Zhou, Yuwei and Zhao, Ziyue and Ma, Xiaohua and Hao, Yue}, biburl = {https://www.bibsonomy.org/bibtex/2ebf487440b5f7f38679bb67b4fbf9527/dblp}, ee = {https://doi.org/10.1007/s11432-021-3377-2}, interhash = {d63cde8786780aa9c5afb3dad1e5b3e8}, intrahash = {ebf487440b5f7f38679bb67b4fbf9527}, journal = {Sci. China Inf. Sci.}, keywords = {dblp}, month = {February}, number = 2, timestamp = {2024-04-08T20:26:27.000+0200}, title = {Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light.}, url = {http://dblp.uni-trier.de/db/journals/chinaf/chinaf66.html#ChenZZMZZZMH23}, volume = 66, year = 2023 }