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%0 Journal Article
%1 journals/dt/NelsonZBPBMBS06
%A Nelson, Jeffrey E.
%A Zanon, Thomas
%A Brown, Jason G.
%A Poku, Osei
%A Blanton, R. D. (Shawn)
%A Maly, Wojciech
%A Benware, Brady
%A Schuermyer, Chris
%D 2006
%J IEEE Des. Test Comput.
%K dblp
%N 5
%P 390-400
%T Extracting Defect Density and Size Distributions from Product ICs.
%U http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06
%V 23
@article{journals/dt/NelsonZBPBMBS06,
added-at = {2020-05-17T00:00:00.000+0200},
author = {Nelson, Jeffrey E. and Zanon, Thomas and Brown, Jason G. and Poku, Osei and Blanton, R. D. (Shawn) and Maly, Wojciech and Benware, Brady and Schuermyer, Chris},
biburl = {https://www.bibsonomy.org/bibtex/223ce9c4dd0510a9dec1acaf5aa213efb/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117},
interhash = {d7ebb4028f70bd8dc35a177723195ce0},
intrahash = {23ce9c4dd0510a9dec1acaf5aa213efb},
journal = {IEEE Des. Test Comput.},
keywords = {dblp},
number = 5,
pages = {390-400},
timestamp = {2020-05-19T12:21:25.000+0200},
title = {Extracting Defect Density and Size Distributions from Product ICs.},
url = {http://dblp.uni-trier.de/db/journals/dt/dt23.html#NelsonZBPBMBS06},
volume = 23,
year = 2006
}