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Extracting Defect Density and Size Distributions from Product ICs.

, , , , , , , и . IEEE Des. Test Comput., 23 (5): 390-400 (2006)

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Edward Poku

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Alex Kwabena Asante Osei

 

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Physically-Aware N-Detect Test Pattern Selection., , , и . DATE, стр. 634-639. ACM, (2008)Automated failure population creation for validating integrated circuit diagnosis methods., , и . DAC, стр. 708-713. ACM, (2009)Test-data volume optimization for diagnosis., , , , , и . DAC, стр. 567-572. ACM, (2012)PADRE: Physically-Aware Diagnostic Resolution Enhancement., , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)Precise failure localization using automated layout analysis of diagnosis candidates., , и . DAC, стр. 367-372. ACM, (2008)Physically-Aware N-Detect Test., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (2): 308-321 (2012)Controlling DPPM through Volume Diagnosis., , , , и . VTS, стр. 134-139. IEEE Computer Society, (2009)A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior., , и . ITC, стр. 1-10. IEEE Computer Society, (2006)Systematic defect identification through layout snippet clustering., , и . ITC, стр. 378-387. IEEE Computer Society, (2010)Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon., , , , , и . ITC, стр. 1-9. IEEE Computer Society, (2008)