%0 Conference Paper %1 conf/latw/SchivittzFMB16 %A Schivittz, Rafael B. %A Franco, Denis Teixeira %A Meinhardt, Cristina %A Butzen, Paulo F. %B LATS %D 2016 %I IEEE %K dblp %P 39-44 %T A probabilistic model for stuck-on faults in combinational logic gates. %U http://dblp.uni-trier.de/db/conf/latw/lats2016.html#SchivittzFMB16 %@ 978-1-5090-1331-9

@inproceedings{conf/latw/SchivittzFMB16, added-at = {2016-12-21T00:00:00.000+0100}, author = {Schivittz, Rafael B. and Franco, Denis Teixeira and Meinhardt, Cristina and Butzen, Paulo F.}, biburl = {https://www.bibsonomy.org/bibtex/26fcfa213c6f6dda95c5de9b73de933e3/dblp}, booktitle = {LATS}, crossref = {conf/latw/2016}, ee = {http://dx.doi.org/10.1109/LATW.2016.7483337}, interhash = {e296c32ec29562986b0d6fa340b37ff4}, intrahash = {6fcfa213c6f6dda95c5de9b73de933e3}, isbn = {978-1-5090-1331-9}, keywords = {dblp}, pages = {39-44}, publisher = {IEEE}, timestamp = {2016-12-22T11:34:28.000+0100}, title = {A probabilistic model for stuck-on faults in combinational logic gates.}, url = {http://dblp.uni-trier.de/db/conf/latw/lats2016.html#SchivittzFMB16}, year = 2016 }