%0 Journal Article %1 journals/et/RavikumarAA97 %A Ravikumar, C. P. %A Agrawal, Nitin %A Agarwal, Parul %D 1997 %J J. Electron. Test. %K dblp %N 3 %P 231-244 %T Hierarchical Delay Test Generation. %U http://dblp.uni-trier.de/db/journals/et/et10.html#RavikumarAA97 %V 10

@article{journals/et/RavikumarAA97, added-at = {2020-09-11T00:00:00.000+0200}, author = {Ravikumar, C. P. and Agrawal, Nitin and Agarwal, Parul}, biburl = {https://www.bibsonomy.org/bibtex/26399ea30c60edee17e258a121eaf529a/dblp}, ee = {https://doi.org/10.1023/A:1008267608838}, interhash = {e8e3f4921a8ed73825d343f48d5651ad}, intrahash = {6399ea30c60edee17e258a121eaf529a}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {231-244}, timestamp = {2020-09-12T11:41:17.000+0200}, title = {Hierarchical Delay Test Generation.}, url = {http://dblp.uni-trier.de/db/journals/et/et10.html#RavikumarAA97}, volume = 10, year = 1997 }