%0 Conference Paper %1 conf/irps/BuryCKCFSWL18 %A Bury, Erik %A Chasin, Adrian Vaisman %A Kaczer, Ben %A Chuang, Kai-Hsin %A Franco, Jacopo %A Simicic, Marko %A Weckx, Pieter %A Linten, Dimitri %B IRPS %D 2018 %I IEEE %K dblp %P 2 %T Self-heating-aware CMOS reliability characterization using degradation maps. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#BuryCKCFSWL18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/BuryCKCFSWL18, added-at = {2023-05-24T00:00:00.000+0200}, author = {Bury, Erik and Chasin, Adrian Vaisman and Kaczer, Ben and Chuang, Kai-Hsin and Franco, Jacopo and Simicic, Marko and Weckx, Pieter and Linten, Dimitri}, biburl = {https://www.bibsonomy.org/bibtex/28b06827d5d5dd1bce85c0b0ac583b6cb/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353541}, interhash = {ebb0e63fc6fcf992dd446b014fe21847}, intrahash = {8b06827d5d5dd1bce85c0b0ac583b6cb}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2024-04-10T16:54:56.000+0200}, title = {Self-heating-aware CMOS reliability characterization using degradation maps.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#BuryCKCFSWL18}, year = 2018 }