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Self-heating-aware CMOS reliability characterization using degradation maps.

, , , , , , , и . IRPS, стр. 2. IEEE, (2018)

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Ana Markovi

Experimental and theoretical analysis of the mass transport through porous glass membranes with different pore diameters. Uni Magdeburg, (2009)

Marko Legler

Untersuchungen zur Konzentration von zyklischem Guanosinmonophosphat (cGMP) im Blutplasma bei Tauben (Columba livia f. dom.) mit experimentell gesteigerter Nachlast und linksventrikulärer Dilatation des Herzens. TierH Hannover, (2009)

Zuzana Markova

Maria Alexander Markou

Dominique Nadine Markowski

 

Другие публикации лиц с тем же именем

Characterization and simulation methodology for time-dependent variability in advanced technologies., , , , , , , , , и 1 other автор(ы). CICC, стр. 1-8. IEEE, (2015)Degradation mechanisms in Germanium Electro-Absorption Modulators., , , , , , , , и . IRPS, стр. 9. IEEE, (2022)Toward 0 V ESD Protection in 2.5D/3D Advanced Bonding Technology., , , , , , и . VLSI Technology and Circuits, стр. 1-2. IEEE, (2024)Self-heating-aware CMOS reliability characterization using degradation maps., , , , , , , и . IRPS, стр. 2. IEEE, (2018)Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow., , , , , , , , , и 5 other автор(ы). ESSDERC, стр. 238-241. IEEE, (2015)ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology., , , , и . ESSDERC, стр. 194-197. IEEE, (2018)Scaling CMOS beyond Si FinFET: an analog/RF perspective., , , , , , , , , и 4 other автор(ы). ESSDERC, стр. 158-161. IEEE, (2018)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , и 4 other автор(ы). Microelectron. Reliab., (2018)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , и . ESSDERC, стр. 226-229. IEEE, (2015)