%0 Journal Article %1 journals/tcad/SyafalniSW18 %A Syafalni, Infall %A Sasao, Tsutomu %A Wen, Xiaoqing %D 2018 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 6 %P 1185-1196 %T A Method to Detect Bit Flips in a Soft-Error Resilient TCAM. %U http://dblp.uni-trier.de/db/journals/tcad/tcad37.html#SyafalniSW18 %V 37

@article{journals/tcad/SyafalniSW18, added-at = {2020-09-24T00:00:00.000+0200}, author = {Syafalni, Infall and Sasao, Tsutomu and Wen, Xiaoqing}, biburl = {https://www.bibsonomy.org/bibtex/2e6559b7f2be98cc0d887ce13bc0bd625/dblp}, ee = {https://doi.org/10.1109/TCAD.2017.2748019}, interhash = {f36af06542ee9ba9ecca4fa897cab79f}, intrahash = {e6559b7f2be98cc0d887ce13bc0bd625}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 6, pages = {1185-1196}, timestamp = {2020-09-25T11:44:57.000+0200}, title = {A Method to Detect Bit Flips in a Soft-Error Resilient TCAM.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad37.html#SyafalniSW18}, volume = 37, year = 2018 }