%0 Journal Article %1 journals/mr/ChanHKYHJ11 %A Chan, Sung-Il %A Hong, W. S. %A Kim, K. T. %A Yoon, Yang Gi %A Han, J. H. %A Jang, Joong Soon %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1806-1809 %T Accelerated life test of high power white light emitting diodes based on package failure mechanisms. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#ChanHKYHJ11 %V 51

@article{journals/mr/ChanHKYHJ11, added-at = {2024-08-14T00:00:00.000+0200}, author = {Chan, Sung-Il and Hong, W. S. and Kim, K. T. and Yoon, Yang Gi and Han, J. H. and Jang, Joong Soon}, biburl = {https://www.bibsonomy.org/bibtex/2464f7230cc4b1dc31234db78b24b8241/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.042}, interhash = {f60569d0acb319ebe059cfbcf1ce510b}, intrahash = {464f7230cc4b1dc31234db78b24b8241}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1806-1809}, timestamp = {2024-08-19T07:09:47.000+0200}, title = {Accelerated life test of high power white light emitting diodes based on package failure mechanisms.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#ChanHKYHJ11}, volume = 51, year = 2011 }