%0 Conference Paper %1 conf/drc/WuATWS18 %A Wu, Ting %A Alharbi, Abdullah %A Taniguchi, Takashi %A Watanabe, Kenji %A Shahrjerdi, Davood %B DRC %D 2018 %I IEEE %K dblp %P 1-2 %T Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs. %U http://dblp.uni-trier.de/db/conf/drc/drc2018.html#WuATWS18 %@ 978-1-5386-3028-0

@inproceedings{conf/drc/WuATWS18, added-at = {2022-04-21T00:00:00.000+0200}, author = {Wu, Ting and Alharbi, Abdullah and Taniguchi, Takashi and Watanabe, Kenji and Shahrjerdi, Davood}, biburl = {https://www.bibsonomy.org/bibtex/206ffc335e726186deacba9b18b17a847/dblp}, booktitle = {DRC}, crossref = {conf/drc/2018}, ee = {https://doi.org/10.1109/DRC.2018.8442196}, interhash = {f787c8b8205c241f89d749ef897697fa}, intrahash = {06ffc335e726186deacba9b18b17a847}, isbn = {978-1-5386-3028-0}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T23:47:17.000+0200}, title = {Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs.}, url = {http://dblp.uni-trier.de/db/conf/drc/drc2018.html#WuATWS18}, year = 2018 }