%0 Conference Paper %1 conf/dac/LiouWCDMKW02 %A Liou, Jing-Jia %A Wang, Li-C. %A Cheng, Kwang-Ting %A Dworak, Jennifer %A Mercer, M. Ray %A Kapur, Rohit %A Williams, Thomas W. %B DAC %D 2002 %I ACM %K dblp %P 371-374 %T Enhancing test efficiency for delay fault testing using multiple-clocked schemes. %U http://dblp.uni-trier.de/db/conf/dac/dac2002.html#LiouWCDMKW02 %@ 1-58113-461-4

@inproceedings{conf/dac/LiouWCDMKW02, added-at = {2018-11-06T00:00:00.000+0100}, author = {Liou, Jing-Jia and Wang, Li-C. and Cheng, Kwang-Ting and Dworak, Jennifer and Mercer, M. Ray and Kapur, Rohit and Williams, Thomas W.}, biburl = {https://www.bibsonomy.org/bibtex/2e4fbed6e4b6305c342d32fedf35ca0e5/dblp}, booktitle = {DAC}, crossref = {conf/dac/2002}, ee = {https://doi.org/10.1145/513918.514013}, interhash = {fb5c3b528d8f56f93f4a7b8a2e719bdb}, intrahash = {e4fbed6e4b6305c342d32fedf35ca0e5}, isbn = {1-58113-461-4}, keywords = {dblp}, pages = {371-374}, publisher = {ACM}, timestamp = {2018-11-07T15:13:19.000+0100}, title = {Enhancing test efficiency for delay fault testing using multiple-clocked schemes.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2002.html#LiouWCDMKW02}, year = 2002 }