%0 Conference Paper %1 conf/itc/FasangSSG85 %A Fasang, Patrick P. %A Schuette, Michael A. %A Shen, John Paul %A Gwaltney, William A. %B ITC %D 1985 %I IEEE Computer Society %K dblp %P 558-564 %T Automated Design for Testability of Semicustom Integrated Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1985.html#FasangSSG85

@inproceedings{conf/itc/FasangSSG85, added-at = {2002-11-11T00:00:00.000+0100}, author = {Fasang, Patrick P. and Schuette, Michael A. and Shen, John Paul and Gwaltney, William A.}, biburl = {https://www.bibsonomy.org/bibtex/272f4fa4e9d11489a69efc59e52b697e5/dblp}, booktitle = {ITC}, crossref = {conf/itc/1985}, date = {2002-11-11}, description = {dblp}, interhash = {1feb57b99c8cef75a20aceae66c835f3}, intrahash = {72f4fa4e9d11489a69efc59e52b697e5}, keywords = {dblp}, pages = {558-564}, publisher = {IEEE Computer Society}, timestamp = {2002-11-11T00:00:00.000+0100}, title = {Automated Design for Testability of Semicustom Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1985.html#FasangSSG85}, year = 1985 }