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%0 Conference Paper
%1 conf/itc/FasangSSG85
%A Fasang, Patrick P.
%A Schuette, Michael A.
%A Shen, John Paul
%A Gwaltney, William A.
%B ITC
%D 1985
%I IEEE Computer Society
%K dblp
%P 558-564
%T Automated Design for Testability of Semicustom Integrated Circuits.
%U http://dblp.uni-trier.de/db/conf/itc/itc1985.html#FasangSSG85
@inproceedings{conf/itc/FasangSSG85,
added-at = {2002-11-11T00:00:00.000+0100},
author = {Fasang, Patrick P. and Schuette, Michael A. and Shen, John Paul and Gwaltney, William A.},
biburl = {https://www.bibsonomy.org/bibtex/272f4fa4e9d11489a69efc59e52b697e5/dblp},
booktitle = {ITC},
crossref = {conf/itc/1985},
date = {2002-11-11},
description = {dblp},
interhash = {1feb57b99c8cef75a20aceae66c835f3},
intrahash = {72f4fa4e9d11489a69efc59e52b697e5},
keywords = {dblp},
pages = {558-564},
publisher = {IEEE Computer Society},
timestamp = {2002-11-11T00:00:00.000+0100},
title = {Automated Design for Testability of Semicustom Integrated Circuits.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1985.html#FasangSSG85},
year = 1985
}