%0 Conference Paper %1 conf/ats/YamazakiY97 %A Yamazaki, Koji %A Yamada, Teruhiko %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 168-173 %T An approach to diagnose logical faults in partially observable sequential circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#YamazakiY97 %@ 0-8186-8209-4

@inproceedings{conf/ats/YamazakiY97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yamazaki, Koji and Yamada, Teruhiko}, biburl = {https://www.bibsonomy.org/bibtex/202d7debf7b72e2d5b6dd7fc83a8c8ce7/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643954}, interhash = {2ce11c7d98fe9a84b85390251f458066}, intrahash = {02d7debf7b72e2d5b6dd7fc83a8c8ce7}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {168-173}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {An approach to diagnose logical faults in partially observable sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#YamazakiY97}, year = 1997 }