%0 Conference Paper %1 conf/itc/MiyamotoMMAYN85 %A Miyamoto, Hiroshi %A Mashiko, Koichiro %A Morooka, Yoshikazu %A Arimoto, Kazutami %A Yamada, Michihiro %A Nakano, T. %B ITC %D 1985 %I IEEE Computer Society %K dblp %P 451-455 %T Test Pattern Considerations for Fault Tolerant High Density DRAM. %U http://dblp.uni-trier.de/db/conf/itc/itc1985.html#MiyamotoMMAYN85

@inproceedings{conf/itc/MiyamotoMMAYN85, added-at = {2002-11-11T00:00:00.000+0100}, author = {Miyamoto, Hiroshi and Mashiko, Koichiro and Morooka, Yoshikazu and Arimoto, Kazutami and Yamada, Michihiro and Nakano, T.}, biburl = {https://www.bibsonomy.org/bibtex/2d7133910a3c8321ba9b6cae2c5495223/dblp}, booktitle = {ITC}, crossref = {conf/itc/1985}, date = {2002-11-11}, description = {dblp}, interhash = {2a6fcd7d6ec02e51bd327ed8df6b11d3}, intrahash = {d7133910a3c8321ba9b6cae2c5495223}, keywords = {dblp}, pages = {451-455}, publisher = {IEEE Computer Society}, timestamp = {2002-11-11T00:00:00.000+0100}, title = {Test Pattern Considerations for Fault Tolerant High Density DRAM.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1985.html#MiyamotoMMAYN85}, year = 1985 }