%0 Journal Article %1 journals/mr/ChenNAaRMNLM16 %A Chen, C. Q. %A Ng, P. T. %A Ang, G. B. %A Tan, H. %A Rivai, Francis %A Ma, Y. Z. %A Ng, H. P. %A Lam, Jeffrey %A Mai, Z. H. %D 2016 %J Microelectron. Reliab. %K dblp %P 317-320 %T Electrical analysis on implantation-related defect by nanoprobing methodology. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16 %V 64

@article{journals/mr/ChenNAaRMNLM16, added-at = {2020-02-22T00:00:00.000+0100}, author = {Chen, C. Q. and Ng, P. T. and Ang, G. B. and Tan, H. and Rivai, Francis and Ma, Y. Z. and Ng, H. P. and Lam, Jeffrey and Mai, Z. H.}, biburl = {https://www.bibsonomy.org/bibtex/2b4cddec2120b15d4a1213aab0d049007/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.091}, interhash = {8a2cb3bc0c22375abe75cfb6251a9b7d}, intrahash = {b4cddec2120b15d4a1213aab0d049007}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {317-320}, timestamp = {2020-02-25T13:23:02.000+0100}, title = {Electrical analysis on implantation-related defect by nanoprobing methodology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16}, volume = 64, year = 2016 }