%0 Journal Article %1 journals/et/BhuniaRR05 %A Bhunia, Swarup %A Raychowdhury, Arijit %A Roy, Kaushik %D 2005 %J J. Electron. Test. %K dblp %N 2 %P 147-159 %T Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current. %U http://dblp.uni-trier.de/db/journals/et/et21.html#BhuniaRR05 %V 21

@article{journals/et/BhuniaRR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Bhunia, Swarup and Raychowdhury, Arijit and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2b532f24c9db5c3c47a2a566b23d31627/dblp}, ee = {https://doi.org/10.1007/s10836-005-6144-3}, interhash = {bfe0cc95919c8cf3277b303b13d71f1c}, intrahash = {b532f24c9db5c3c47a2a566b23d31627}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {147-159}, timestamp = {2024-05-13T07:29:33.000+0200}, title = {Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current.}, url = {http://dblp.uni-trier.de/db/journals/et/et21.html#BhuniaRR05}, volume = 21, year = 2005 }