%0 Conference Paper %1 conf/itc/Crosby84 %A Crosby, Brian C. %B ITC %D 1984 %I IEEE Computer Society %K dblp %P 206-211 %T Adapting CAE Design Information for In-Circuit Test Generation. %U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#Crosby84

@inproceedings{conf/itc/Crosby84, added-at = {2002-11-22T00:00:00.000+0100}, author = {Crosby, Brian C.}, biburl = {https://www.bibsonomy.org/bibtex/2f8667a78a1f4c5ac755f0916c66e0aba/dblp}, booktitle = {ITC}, crossref = {conf/itc/1984}, date = {2002-11-22}, description = {dblp}, interhash = {0b0824a3d9eccd0bb88c9c23888b9841}, intrahash = {f8667a78a1f4c5ac755f0916c66e0aba}, keywords = {dblp}, pages = {206-211}, publisher = {IEEE Computer Society}, timestamp = {2002-11-22T00:00:00.000+0100}, title = {Adapting CAE Design Information for In-Circuit Test Generation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#Crosby84}, year = 1984 }