%0 Conference Paper %1 conf/ets/TuduLSF10 %A Tudu, Jaynarayan T. %A Larsson, Erik %A Singh, Virendra %A Fujiwara, Hideo %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 259 %T Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#TuduLSF10 %@ 978-1-4244-5833-2

@inproceedings{conf/ets/TuduLSF10, added-at = {2017-05-22T00:00:00.000+0200}, author = {Tudu, Jaynarayan T. and Larsson, Erik and Singh, Virendra and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2ec3c73674391f979effadb6f3e47fba8/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512732}, interhash = {3325c3cb815807c3f89c84d56b3b6aac}, intrahash = {ec3c73674391f979effadb6f3e47fba8}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = 259, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#TuduLSF10}, year = 2010 }