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Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach.

, , , and . European Test Symposium, page 259. IEEE Computer Society, (2010)

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Cramer-Rao bounds for continuous-time AR parameter estimation with irregular sampling., and . ICASSP, page 3097-3100. IEEE, (2001)Preemptive System-on-Chip Test Scheduling., and . IEICE Trans. Inf. Syst., 87-D (3): 620-629 (2004)Time of arrival estimation of narrowband TDMA signals for mobile positioning., , , , , and . PIMRC, page 451-455. IEEE, (1998)Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687., , , and . IEEE Des. Test Comput., 29 (2): 79-88 (2012)Student-oriented examination in a computer architecture course., and . ITiCSE, page 245. ACM, (2004)A suite of IEEE 1687 benchmark networks., , , , , , , , and . ITC, page 1-10. IEEE, (2016)Robustness of TAP-based scan networks., , and . ITC, page 1-10. IEEE Computer Society, (2014)Adaptive execution assistance for multiplexed fault-tolerant chip multiprocessors., , , and . ICCD, page 419-426. IEEE Computer Society, (2011)Design, Verification, and Application of IEEE 1687., , , , and . ATS, page 93-100. IEEE Computer Society, (2014)Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints., , , , and . Asian Test Symposium, page 525-531. IEEE Computer Society, (2011)