%0 Conference Paper %1 conf/irps/LiuSKCLKKJJKHPP15 %A Liu, Changze %A Sagong, Hyun-Chul %A Kim, Hyejin %A Choo, Seungjin %A Lee, Hyunwoo %A Kim, Yoohwan %A Kim, Hyunjin %A Jo, Bisung %A Jin, Minjung %A Kim, Jinjoo %A Ha, Sangsu %A Pae, Sangwoo %A Park, Jongwoo %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#LiuSKCLKKJJKHPP15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/LiuSKCLKKJJKHPP15, added-at = {2024-03-04T00:00:00.000+0100}, author = {Liu, Changze and Sagong, Hyun-Chul and Kim, Hyejin and Choo, Seungjin and Lee, Hyunwoo and Kim, Yoohwan and Kim, Hyunjin and Jo, Bisung and Jin, Minjung and Kim, Jinjoo and Ha, Sangsu and Pae, Sangwoo and Park, Jongwoo}, biburl = {https://www.bibsonomy.org/bibtex/22bee22b22122ca82d4fdd53d7db38a0f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112693}, interhash = {3409e79dde873934fa9df434fc5f76e4}, intrahash = {2bee22b22122ca82d4fdd53d7db38a0f}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2024-04-10T16:54:51.000+0200}, title = {Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#LiuSKCLKKJJKHPP15}, year = 2015 }