%0 Journal Article %1 journals/mr/EsselyDPRBGBPTL06 %A Essely, Fabien %A Darracq, Frédéric %A Pouget, Vincent %A Remmach, Mustapha %A Beaudoin, Felix %A Guitard, Nicolas %A Bafleur, Marise %A Perdu, Philippe %A Touboul, André %A Lewis, Dean %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1563-1568 %T Application of various optical techniques for ESD defect localization. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#EsselyDPRBGBPTL06 %V 46

@article{journals/mr/EsselyDPRBGBPTL06, added-at = {2020-02-22T00:00:00.000+0100}, author = {Essely, Fabien and Darracq, Frédéric and Pouget, Vincent and Remmach, Mustapha and Beaudoin, Felix and Guitard, Nicolas and Bafleur, Marise and Perdu, Philippe and Touboul, André and Lewis, Dean}, biburl = {https://www.bibsonomy.org/bibtex/2b895d4b3ff63a34d7499010994544fd9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.021}, interhash = {386eede72fe29a3ac888280dbf91204a}, intrahash = {b895d4b3ff63a34d7499010994544fd9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1563-1568}, timestamp = {2020-02-25T13:30:16.000+0100}, title = {Application of various optical techniques for ESD defect localization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#EsselyDPRBGBPTL06}, volume = 46, year = 2006 }