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Application of various optical techniques for ESD defect localization., , , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1563-1568 (2006)Effect of Temperature on Single Event Latchup Sensitivity., , , , , , , and . DTIS, page 1-5. IEEE, (2020)Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection., , , and . LATS, page 1-6. IEEE, (2018)Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods., , , , and . SBCCI, page 1-6. IEEE, (2018)Effects of 1064 nm laser on MOS capacitor., , , , , , and . Microelectron. Reliab., 52 (9-10): 1816-1821 (2012)Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation., , , , , and . Microelectron. Reliab., 46 (9-11): 1514-1519 (2006)Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications., , , and . IOLTS, page 291-294. IEEE, (2018)Effect of physical defect on shmoos in CMOS DSM technologies., , , , , , , and . Microelectron. Reliab., 48 (8-9): 1333-1338 (2008)Electrical Modeling for Laser Testing with Different Pulse Durations., , , , and . IOLTS, page 9-13. IEEE Computer Society, (2005)An Overview of the Applications of a Pulsed Laser System for SEU Testing., , , , , , , and . IOLTW, page 52-. IEEE Computer Society, (2000)