%0 Journal Article %1 journals/mr/ChithambaramTZL18 %A Chithambaram, Shaalini %A Tan, Pik Kee %A Zhao, Yuzhe %A Liu, Binghai %A Ma, Yinzhe %A Quah, Alfred %A Nagalingam, Dayanand %A Pan, Yanlin %A Mai, Zhihong %D 2018 %J Microelectron. Reliab. %K dblp %P 321-333 %T Failure analysis on 14 nm FinFET devices with ESD CDM failure. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#ChithambaramTZL18 %V 88-90

@article{journals/mr/ChithambaramTZL18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Chithambaram, Shaalini and Tan, Pik Kee and Zhao, Yuzhe and Liu, Binghai and Ma, Yinzhe and Quah, Alfred and Nagalingam, Dayanand and Pan, Yanlin and Mai, Zhihong}, biburl = {https://www.bibsonomy.org/bibtex/2573ac14cf65c8f9c14648caf59ec1b15/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.105}, interhash = {4239e5caa7c0df4a089943a9264b3ee0}, intrahash = {573ac14cf65c8f9c14648caf59ec1b15}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {321-333}, timestamp = {2020-02-25T13:27:55.000+0100}, title = {Failure analysis on 14 nm FinFET devices with ESD CDM failure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#ChithambaramTZL18}, volume = {88-90}, year = 2018 }