Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Failure analysis on 14 nm FinFET devices with ESD CDM failure.

S. Chithambaram, P. Tan, Y. Zhao, B. Liu, Y. Ma, A. Quah, D. Nagalingam, Y. Pan, and Z. Mai. Microelectron. Reliab., (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yuzhe Tang

Zhao Zhao

Yanning Zhao

Hertz-level ultra-stable laser and its application to high precision spectroscopyY. Zhao. Uni Erlangen-Nürnberg, (2009)

Xiaojian Zhao

Su Zhao

Other publications of authors with the same name

Mobile Crowd Sensing Service Platform for Social Security Incidents in Edge Computing.Y. Zhao, Z. Li, X. Chen, and Y. Chen. iThings/GreenCom/CPSCom/SmartData, page 568-574. IEEE, (2018)A Pricing Incentive Mechanism for Mobile Crowd Sensing in Edge Computing.X. Chen, Z. Li, L. Qi, Y. Chen, Y. Zhao, and S. Chen. MobiCASE, volume 290 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, page 184-197. Springer, (2019)Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue.H. Yap, P. Tan, L. Zhu, H. Feng, Y. Zhao, R. He, H. Tan, B. Liu, Y. Huang, D. Wang and 2 other author(s). Microelectron. Reliab., (2016)Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.Y. Zhao, Q. Wang, P. Tan, H. Yap, B. Liu, H. Feng, H. Tan, R. He, Y. Huang, D. Wang and 5 other author(s). Microelectron. Reliab., (2016)Failure analysis on 14 nm FinFET devices with ESD CDM failure.S. Chithambaram, P. Tan, Y. Zhao, B. Liu, Y. Ma, A. Quah, D. Nagalingam, Y. Pan, and Z. Mai. Microelectron. Reliab., (2018)Incentive Mechanism Design Based on Stochastic Game for Multi-modality Crowd Sensing.X. Chen, Y. Zhao, Z. Li, and Y. Chen. SmartIoT, page 222-228. IEEE, (2018)Solving 28 nm I/O circuit reliability issue due to IC design weakness.Y. Low, P. Tan, S. Tan, Y. Zhao, and J. Lam. Microelectron. Reliab., (2018)Economic evaluation on container shipping route selection.B. Lu, H. Qiao, Y. Zhao, X. Yang, G. Hua, and X. Zhang. Int. J. Manuf. Technol. Manag., 32 (2): 85-101 (2018)Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.H. Yap, P. Tan, G. Low, M. Dawood, H. Feng, Y. Zhao, R. He, H. Tan, J. Zhu, B. Liu and 4 other author(s). Microelectron. Reliab., 55 (9-10): 1611-1616 (2015)Cross-sectional nanoprobing fault isolation technique on submicron devices.P. Tan, H. Yap, C. Chen, F. Rivai, Y. Zhao, L. Zhu, H. Feng, H. Tan, R. He, D. Wang and 4 other author(s). Microelectron. Reliab., (2016)

BibSonomy

Disambiguation of "Zhao, Yuzhe"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Failure analysis on 14 nm FinFET devices with ESD CDM failure.

Please choose a person to relate this publication to

Yuzhe Tang

Zhao Zhao

Yanning Zhao

Xiaojian Zhao

Su Zhao

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Zhao, Yuzhe"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Failure analysis on 14 nm FinFET devices with ESD CDM failure.

Please choose a person to relate this publication to

Yuzhe Tang

Zhao Zhao

Yanning Zhao

Xiaojian Zhao

Su Zhao

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Failure analysis on 14 nm FinFET devices with ESD CDM failure.