%0 Conference Paper %1 conf/irps/LeurquinVVGESDI22 %A Leurquin, Camille %A Vandendaele, William %A Viey, Aby-Gaël %A Gwoziecki, Romain %A Escoffier, René %A Salot, R. %A Despesse, Ghislain %A Iucolano, Ferdinando %A Modica, Roberto %A Constant, Aurore %B IRPS %D 2022 %I IEEE %K dblp %P 10 %T Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LeurquinVVGESDI22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/LeurquinVVGESDI22, added-at = {2024-07-08T00:00:00.000+0200}, author = {Leurquin, Camille and Vandendaele, William and Viey, Aby-Gaël and Gwoziecki, Romain and Escoffier, René and Salot, R. and Despesse, Ghislain and Iucolano, Ferdinando and Modica, Roberto and Constant, Aurore}, biburl = {https://www.bibsonomy.org/bibtex/254de4f05ae7b6e411279d1fafa0dc2ec/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764482}, interhash = {6a6f0eca4cfa40c97484aa45b52f0b71}, intrahash = {54de4f05ae7b6e411279d1fafa0dc2ec}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 10, publisher = {IEEE}, timestamp = {2024-07-15T07:17:46.000+0200}, title = {Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LeurquinVVGESDI22}, year = 2022 }