@inproceedings{conf/irps/MukherjeeSMZMYG20,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Mukherjee, Kalparupa and Santi, Carlo De and Meneghesso, Gaudenzio and Zanoni, Enrico and Meneghini, Matteo and You, Shuzhen and Geens, Karen and Borga, Matteo and Bakeroot, Benoit and Decoutere, Stefaan},
biburl = {https://www.bibsonomy.org/bibtex/2b9d7d2ea5d4160ca7ba13825aefad5d0/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9129098},
interhash = {7b8f98d07a42ec21e4ff3cc5e2cbaa9a},
intrahash = {b9d7d2ea5d4160ca7ba13825aefad5d0},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2024-05-13T09:41:10.000+0200},
title = {Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#MukherjeeSMZMYG20},
year = 2020
}