%0 Conference Paper %1 conf/ats/IshikawaYH10 %A Ishikawa, Masashi %A Yotsuyanagi, Hiroyuki %A Hashizume, Masaki %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 163-166 %T Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#IshikawaYH10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/IshikawaYH10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ishikawa, Masashi and Yotsuyanagi, Hiroyuki and Hashizume, Masaki}, biburl = {https://www.bibsonomy.org/bibtex/2c11f507ad22921278019e24c92bcda95/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.37}, interhash = {82c27da40bf6e50f56eac05eab44b988}, intrahash = {c11f507ad22921278019e24c92bcda95}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {163-166}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#IshikawaYH10}, year = 2010 }