%0 Conference Paper %1 conf/irps/NairBTZCGKC19 %A Nair, Sarath Mohanachandran %A Bishnoi, Rajendra %A Tahoori, Mehdi Baradaran %A Zahedmanesh, Houman %A Croes, Kristof %A Garello, Kevin %A Kar, Gouri Sankar %A Catthoor, Francky %B IRPS %D 2019 %I IEEE %K dblp %P 1-6 %T Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#NairBTZCGKC19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/NairBTZCGKC19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Nair, Sarath Mohanachandran and Bishnoi, Rajendra and Tahoori, Mehdi Baradaran and Zahedmanesh, Houman and Croes, Kristof and Garello, Kevin and Kar, Gouri Sankar and Catthoor, Francky}, biburl = {https://www.bibsonomy.org/bibtex/2524bd90d984875551cd5af22e00f0312/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720559}, interhash = {9233bd64ba77a5b1c774b241ff4c9ca1}, intrahash = {524bd90d984875551cd5af22e00f0312}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T14:45:22.000+0200}, title = {Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#NairBTZCGKC19}, year = 2019 }