%0 Conference Paper %1 conf/ets/NodaKSMWM10 %A Noda, Mitsumasa %A Kajihara, Seiji %A Sato, Yasuo %A Miyase, Kohei %A Wen, Xiaoqing %A Miura, Yukiya %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 107-111 %T On estimation of NBTI-Induced delay degradation. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#NodaKSMWM10 %@ 978-1-4244-5833-2

@inproceedings{conf/ets/NodaKSMWM10, added-at = {2017-05-22T00:00:00.000+0200}, author = {Noda, Mitsumasa and Kajihara, Seiji and Sato, Yasuo and Miyase, Kohei and Wen, Xiaoqing and Miura, Yukiya}, biburl = {https://www.bibsonomy.org/bibtex/2e812b48f8fa24ece0b6feab059d2eefe/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512772}, interhash = {9cd43b90772554810b531395678d81d9}, intrahash = {e812b48f8fa24ece0b6feab059d2eefe}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = {107-111}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {On estimation of NBTI-Induced delay degradation.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#NodaKSMWM10}, year = 2010 }