%0 Conference Paper %1 conf/vts/PowellBAHP94 %A Powell, Theo J. %A Butler, Kenneth M. %A Ales, Mike %A Haley, Roy %A Perry, Mark %B VTS %D 1994 %I IEEE Computer Society %K dblp %P 192-196 %T Correlating defect level to final test fault coverage for modular structured designs microcontroller family. %U http://dblp.uni-trier.de/db/conf/vts/vts1994.html#PowellBAHP94 %@ 0-8186-5440-6

@inproceedings{conf/vts/PowellBAHP94, added-at = {2023-03-24T00:00:00.000+0100}, author = {Powell, Theo J. and Butler, Kenneth M. and Ales, Mike and Haley, Roy and Perry, Mark}, biburl = {https://www.bibsonomy.org/bibtex/22daa5a070e24426071e63fdcf96b4bee/dblp}, booktitle = {VTS}, crossref = {conf/vts/1994}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1994.292314}, interhash = {9ef15508a2629e73897eb33dcfef0623}, intrahash = {2daa5a070e24426071e63fdcf96b4bee}, isbn = {0-8186-5440-6}, keywords = {dblp}, pages = {192-196}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:27.000+0200}, title = {Correlating defect level to final test fault coverage for modular structured designs [microcontroller family].}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1994.html#PowellBAHP94}, year = 1994 }